Time-of-flight heavy ion backscattering spectrometry
نویسندگان
چکیده
منابع مشابه
Heavy Ion Backscattering Spectrometry Analysis of TXRF Calibration Standards
Within a relatively short period of time Total Reflection X-ray Fluorescence (TXRF) has become one of the most widely used techniques in determining trace levels of surface metallic contamination introduced by a variety of semiconductor processing procedures and equipment. Unfortunately, TXRF is not a first principles technique, and the answers one obtains are only as good as the standards used...
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We report on the performance of structures for lossless ion manipulation (SLIM) as a means for transmitting ions and performing ion mobility separations (IMS). Ions were successfully transferred from an electrospray ionization (ESI) source to the TOF MS analyzer by means of a linear SLIM, demonstrating lossless ion transmission and an alternative arrangement including a 90° turn. First, the lin...
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ژورنال
عنوان ژورنال: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
سال: 1994
ISSN: 0168-583X
DOI: 10.1016/0168-583x(94)95777-0